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内存容限测试的分析及优化方案

发表时间:2012-04-30  浏览量:1971  下载量:1297
全部作者: 薛长英,付宇卓
作者单位: 上海交通大学微电子学院
摘 要: 通过分析大量内存容限测试数据,发现测试中发生逻辑失效的地址区域通常位于内存边界附近,因此利用内存映射定位内存的边界区域,并将其作为内存容限测试的目标测试区域。通过这种方式测试可以大大减少目标测试区域大小,集中测试边界区域。评测结果表明:利用边界定位的优化方案可以快速有效地定位失效区域并大幅减少测试用时。
关 键 词: 计算机技术;边界定位;内存映射;内存容限测试;
Title: Analysis and optimization program for memory margin test
Author: XUE Changying, FU Yuzhuo
Organization: School of Microelectronics, Shanghai Jiao Tong University
Abstract: Based on careful analysis of the current memory margin test result, this paper presents a way that memory mapping is used to locate boundaries of memory as a target test area in memory margin test. In this way, memory margin test can prodigiously reduce the target test area size and focus on testing the boundary areas in process. Evaluation results show that the optimization using the boundary location can quickly and efficiently locate the failure areas and significantly reduce the test duration.
Key words: computer technology; boundary location; memory mapping; memory margin test
发表期数: 2012年4月第8期
引用格式: 薛长英,付宇卓. 内存容限测试的分析及优化方案[J]. 中国科技论文在线精品论文,2012,5(8):742-749.
 
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