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压阻式阵列自动测试分析系统的设计与实现

发表时间:2019-06-28  浏览量:165  下载量:11
全部作者: 梅海霞,于赫,程子轩,王佳宁,于存江
作者单位: 长春大学电子信息工程学院
摘 要: 设计并制作了一种基于行列扫描技术的压阻阵列自动测试分析系统,其大大提高了触觉采样的速度。触觉图像采样频率的提高,为整个触觉系统的实时处理创造了条件。实验结果显示,该自动测试分析设备能够实时、准确地显示触觉传感阵列所受力的大小和方位,且该方法可进一步推广并应用到其他不同的压阻传感阵列测试上。
关 键 词: 电子技术;测试系统;行列扫描;触觉传感器
Title: Design and implementation of automatic test analysis system for piezoresistive array
Author: MEI Haixia, YU He, CHENG Zixuan, WANG Jianing, YU Cunjiang
Organization: School of Electronic and Information Engineering, Changchun University
Abstract: In this paper, an automatic test analysis system for piezoresistive array based on line-scan technology is designed and produced, which greatly improves the speed of tactile sampling. The improving of the tactile image sampling frequency creates conditions for real-time processing of the whole tactile system. The experimental results show that the automatic test analysis equipment can display the force and its orientation on the tactile sensor array in real time and accurately, and the method can be spread and used to other different piezoresistive sensor array tests.
Key words: electronic technology; test system; line-scan; tactile sensor
发表期数: 2019年6月第3期
引用格式: 梅海霞,于赫,程子轩,等. 压阻式阵列自动测试分析系统的设计与实现[J]. 中国科技论文在线精品论文,2019,12(3):422-428.
 
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